(Peer-Reviewed) Meta-lens digital image correlation
Zhou Zhao ¹, Xiaoyuan Liu 刘小源 ², Yu Ji ¹, Yukun Zhang ¹, Yong Chen ¹, Zhendong Luo 罗振东 ³, Yuzhou Song ⁴, Zihan Geng 耿子涵 ⁴, Takuo Tanaka ⁵ ⁶ ⁷, Fei Qi 齐飞 ¹, Shengxian Shi 施圣贤 ¹, Mu Ku Chen 陈沐谷 ² ³
¹ School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240, China
中国 上海 上海交通大学机械与动力工程学院
² The State Key Laboratory of Terahertz and Millimeter Waves, City University of Hong Kong, Kowloon, Hong Kong 999077, China
中国 香港 香港城市大学太赫兹及毫米波全国重点实验室
³ Department of Electrical Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong 999077, China
中国 香港 香港城市大学电机工程系
⁴ Ministry Institute of Data and Information, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen 518071, China
中国 深圳 清华大学深圳国际研究生院 数据与信息研究院
⁵ Innovative Photon Manipulation Research Team, RIKEN Center for Advanced Photonics, Saitama 351-0198, Japan
⁶ Metamaterial Laboratory, RIKEN Cluster for Pioneering Research, Saitama 351-0198, Japan
⁷ Institute of Post-LED Photonics, Tokushima University, Tokushima 770-8506, Japan
Opto-Electronic Advances, 2025-07-29
Abstract
With the same level of measurement accuracy, more portable and miniaturized measurement systems will have greater advantages, providing users with more flexible and convenient measurement solutions. Here, we introduce a new type of digital image correlation (DIC) system that incorporates a binocular meta-lens, featuring a simple and compact configuration.
Meta-lens is one of the promising flat optical imaging devices that are ultra-thin, customizable, and well-suited for use in confined spaces. We evaluated this binocular meta-lens based DIC(BM-DIC) system through classic in-plane and out-of-plane translation tests, followed by a bending test on a helicopter wing model to capture 3D displacement and deformation fields. For in-plane translations, the system achieved high precision with a standard deviation (σ) below 2 µm. Despite a small baseline of 4 mm, the system maintained a σ of approximately 32 µm for out-of-plane translations.
Comparative analysis with conventional dual-camera stereo DIC systems showed that the BM-DIC system maintains an acceptable relative error margin of about 1% in measured strain fields despite a 75-fold reduction in baseline length. This research demonstrates the integration of DIC techniques with advanced meta-lens technology, indicating substantial potential to enhance the capabilities of DIC technology in experimental solid mechanics.
CW laser damage of ceramics induced by air filament
Chuan Guo, Kai Li, Zelin Liu, Yuyang Chen, Junyang Xu, Zhou Li, Wenda Cui, Changqing Song, Cong Wang, Xianshi Jia, Ji'an Duan, Kai Han
Opto-Electronic Advances
2025-06-27
Operando monitoring of state of health for lithium battery via fiber optic ultrasound imaging system
Chen Geng, Wang Anqi, Zhang Yi, Zhang Fujun, Xu Dongchen, Liu Yueqi, Zhang Zhi, Yan Zhijun, Li Zhen, Li Hao, Sun Qizhen
Opto-Electronic Science
2025-06-25
Observation of polaronic state assisted sub-bandgap saturable absorption
Li Zhou, Yiduo Wang, Jianlong Kang, Xin Li, Quan Long, Xianming Zhong, Zhihui Chen, Chuanjia Tong, Keqiang Chen, Zi-Lan Deng, Zhengwei Zhang, Chuan-Cun Shu, Yongbo Yuan, Xiang Ni, Si Xiao, Xiangping Li, Yingwei Wang, Jun He
Opto-Electronic Advances
2025-06-19
Embedded solar adaptive optics telescope: achieving compact integration for high-efficiency solar observations
Naiting Gu, Hao Chen, Ao Tang, Xinlong Fan, Carlos Quintero Noda, Yawei Xiao, Libo Zhong, Xiaosong Wu, Zhenyu Zhang, Yanrong Yang, Zao Yi, Xiaohu Wu, Linhai Huang, Changhui Rao
Opto-Electronic Advances
2025-05-27
Wearable photonic smart wristband for cardiorespiratory function assessment and biometric identification
Wenbo Li, Yukun Long, Yingyin Yan, Kun Xiao, Zhuo Wang, Di Zheng, Arnaldo Leal-Junior, Santosh Kumar, Beatriz Ortega, Carlos Marques, Xiaoli Li, Rui Min
Opto-Electronic Advances
2025-05-27
Integrated photonic polarizers with 2D reduced graphene oxide
Junkai Hu, Jiayang Wu, Di Jin, Wenbo Liu, Yuning Zhang, Yunyi Yang, Linnan Jia, Yijun Wang, Duan Huang, Baohua Jia, David J. Moss
Opto-Electronic Science
2025-05-22