(Peer-Reviewed) Enrichment strategies in surface-enhanced Raman scattering: theoretical insights and optical design for enhanced light-matter interaction
Zhiyang Pei, Chang Ji, Mingrui Shao, Yang Wu, Xiaofei Zhao, Baoyuan Man, Zhen Li, Jing Yu, Chao Zhang
School of Physics and Electronics, Shandong Normal University, Jinan 250014, China
中国 济南 山东师范大学物理与电子科学学院
Opto-Electronic Science, 2025-09-18
Abstract
Surface-enhanced Raman scattering (SERS) is a powerful molecular fingerprinting technique widely applied across physical chemistry, environmental monitoring, and public safety. While hotspot engineering has driven significant advances, a critical limitation persists: the reliable detection of analytes lacking affinity for plasmonic surfaces remains challenging. Despite extensive reviews on SERS substrates and hotspots (>300 in recent years), none systematically address analyte manipulation as a complementary paradigm for overcoming this universal detection barrier.
This review uniquely synthesizes the rapidly evolving field of analyte enrichment strategies—categorized as chemical, physical, and macroscopic force field approaches—and demonstrates their integration with engineered hotspots as a multifaceted solution. We highlight how this synergy achieves unprecedented sensitivity enhancements (104–1015 fold), unattainable through hotspot engineering alone.
Finally, we emphasize the current challenges in this research area and propose new research directions aimed at developing efficient SERS designs that are critical for real-world applications.
Flicker minimization in power-saving displays enabled by measurement of difference in flexoelectric coefficients and displacement-current in positive dielectric anisotropy liquid crystals
Junho Jung, HaYoung Jung, GyuRi Choi, HanByeol Park, Sun-Mi Park, Ki-Sun Kwon, Heui-Seok Jin, Dong-Jin Lee, Hoon Jeong, JeongKi Park, Byeong Koo Kim, Seung Hee Lee, MinSu Kim
Opto-Electronic Advances
2025-09-25
Dual-frequency angular-multiplexed fringe projection profilometry with deep learning: breaking hardware limits for ultra-high-speed 3D imaging
Wenwu Chen, Yifan Liu, Shijie Feng, Wei Yin, Jiaming Qian, Yixuan Li, Hang Zhang, Maciej Trusiak, Malgorzata Kujawinska, Qian Chen, Chao Zuo
Opto-Electronic Advances
2025-09-25