(Peer-Reviewed) The CUSUM statistic of change point under NA sequences
	
		Jin Ling ¹, Xiao-qin Li 李晓琴 ², Wen-zhi Yang 杨文志 ², Jian-ling Jiao 焦建玲 ¹
			
				¹ School of Management, Hefei University of Technology, Hefei, 230009, China
中国 合肥 合肥工业大学管理学院
² Center for Applied Mathematics, School of Mathematical Sciences, Anhui University, Hefei, 230061, China
中国 合肥 安徽大学数学科学学院 应用数学中心
			
			
		
		
			
		
		
	 
	
	
	Abstract
In this paper, we investigate the CUSUM statistic of change point under the negatively associated (NA) sequences. By establishing the consistency estimators for mean and covariance functions respectively, the limit distribution of the CUSUM statistic is proved to be a standard Brownian bridge, which extends the results obtained under the case of an independent normal sample and the moving average processes. 
Finally, the finite sample properties of the CUSUM statistic are given to show the efficiency of the method by simulation studies and an application on a real data analysis.
	
	
	
	
	
	
		    
		    
    			
		    
    			
		        Meta-lens digital image correlation
		        
		        Zhou Zhao,  Xiaoyuan Liu,  Yu Ji,  Yukun Zhang,  Yong Chen,  Zhendong Luo,  Yuzhou Song,  Zihan Geng,  Takuo Tanaka,  Fei Qi,  Shengxian Shi,  Mu Ku Chen
		        Opto-Electronic Advances
		        
		        		        		2025-07-29
		        	
		     
		    
    			
		        Broadband ultrasound generator over fiber-optic tip for in vivo emotional stress modulation
		        
		        Jiapu Li,  Xinghua Liu,  Zhuohua Xiao,  Shengjiang Yang,  Zhanfei Li,  Xin Gui,  Meng Shen,  He Jiang,  Xuelei Fu,  Yiming Wang,  Song Gong,  Tuan Guo,  Zhengying Li
		        Opto-Electronic Science
		        
		        		        		2025-07-25
		        	
		     
		    
    			
		    
    			
		        Review for wireless communication technology based on digital encoding metasurfaces
		        
		        Haojie Zhan,  Manna Gu,  Ying Tian,  Huizhen Feng,  Mingmin Zhu,  Haomiao Zhou,  Yongxing Jin,  Ying Tang,  Chenxia Li,  Bo Fang,  Zhi Hong,  Xufeng Jing,  Le Wang
		        Opto-Electronic Advances
		        
		        		        		2025-07-17