(Peer-Reviewed) The real-time dynamic holographic display of LN:Bi,Mg crystals and defect-related electron mobility
Shuolin Wang 王烁琳, Yidong Shan 单益东, Dahuai Zheng 郑大怀, Shiguo Liu 刘士国, Fang Bo 薄方, Hongde Liu 刘宏德, Yongfa Kong 孔勇发, Jingjun Xu 许京军
MOE Key Laboratory of Weak-Light Nonlinear Photonics, TEDA Institute of Applied Physics and School of Physics, Nankai University, Tianjin 300457, China
中国 天津 泰达应用物理研究院 南开大学物理学院 弱光非线性光子学教育部重点实验室
Opto-Electronic Advances, 2022-07-27
Abstract
Holographic display has attracted widespread interest because of its ability to show the complete information of the object and bring people an unprecedented sense of presence. The absence of ideal recording materials has hampered the realization of their commercial applications.
Here we report that the response time of a bismuth and magnesium co-doped lithium niobate (LN:Bi,Mg) crystal is shortened to 7.2 ms and a sensitivity as high as 646 cm/J. The crystal was used to demonstrate a real-time holographic display with a refresh rate of 60 Hz, as that of the popular high-definition television.
Moreover, the first-principles calculations indicate that the electron mobility while Bi occupying Nb-site is significantly greater than that in Li-site, which directly induces the fast response of LN:Bi,Mg crystals when the concentration of Mg is above its doping threshold.
Flicker minimization in power-saving displays enabled by measurement of difference in flexoelectric coefficients and displacement-current in positive dielectric anisotropy liquid crystals
Junho Jung, HaYoung Jung, GyuRi Choi, HanByeol Park, Sun-Mi Park, Ki-Sun Kwon, Heui-Seok Jin, Dong-Jin Lee, Hoon Jeong, JeongKi Park, Byeong Koo Kim, Seung Hee Lee, MinSu Kim
Opto-Electronic Advances
2025-09-25
Dual-frequency angular-multiplexed fringe projection profilometry with deep learning: breaking hardware limits for ultra-high-speed 3D imaging
Wenwu Chen, Yifan Liu, Shijie Feng, Wei Yin, Jiaming Qian, Yixuan Li, Hang Zhang, Maciej Trusiak, Malgorzata Kujawinska, Qian Chen, Chao Zuo
Opto-Electronic Advances
2025-09-25